3D Surface Roughness and Wear Measurement, Analysis and Inspection

Short Wavelength Pass Filter

L-Filter

The L-Filter is used to attenuate the longer spatial wavelength structures that may be present in the measured surface, which are not relevant to the attended application and may affect subsequent analyses. The figure below demonstrates an L-Filter used to remove the longer spaced spatial structure revealing the finer spaced texture and peaked features..

When only an L-filter is used, the type of filtering is termed Short Wavelength Pass.


As measured surface without filtering consisting of finer spaced features superimposed on longer wavelength components.

L-Filter applied to eliminate longer spatial wavelengths, revealing the finer spaced features.