About Michigan Metrology
Michigan Metrology was formed in 1994 by Donald K. Cohen, Ph.D., to provide industries with 3D surface finish & wear measurement and analysis services. Using the NPFlex 3D Optical Profiler from Bruker Corporation and a host of advanced analysis software, Michigan Metrology provides solutions for many types of surface related development and manufacturing process problems.
Clients range from small, exciting start-up ventures to Fortune 500 companies in the automotive, biomedical and materials industries. Projects are constantly being performed to address problems from new product development to pressing warranty issues.
Donald K. Cohen, PhD
Dr. Cohen's background is primarily in the physical sciences with a B.S. / M.S. in Physics and a Ph.D. in Optical Sciences. Prior to forming Michigan Metrology, Dr. Cohen was V.P. of Engineering at WYKO Corporation (now part of Bruker Corporation), developing surface metrology instruments. Dr. Cohen is a co-inventor of the technology comprising Bruker's optical profilers. He served as Vice Chairman/Chairman of the ANSI/ASME B46.1 Surface Texture Standards committee from 2000-2011.